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Joseph Fowler

Publications

A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap

Author(s)
Paul Szypryt, Galen C. O'Neil, Endre Takacs, Joseph N. Tan, Sean W. Buechele, Aung Naing, Douglas A. Bennett, William B. Doriese, Malcolm S. Durkin, Joseph W. Fowler, Johnathon D. Gard, Gene C. Hilton, Kelsey M. Morgan, Carl D. Reintsema, Daniel R. Schmidt, Daniel S. Swetz, Joel N. Ullom, Yuri Ralchenko
We report on the design, commissioning, and initial measurements of a Transition-Edge Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap (EBIT) at

A TES X-ray Spectrometer for NSENSE

Author(s)
Christine G. Pappas, Malcolm S. Durkin, Joseph W. Fowler, Kelsey M. Morgan, Joel N. Ullom, William B. Doriese, Gene C. Hilton, Galen C. O'Neil, Daniel R. Schmidt, Paul Szypryt, Daniel S. Swetz
The Non-destructive Statistical Estimation of Nanoscale Structures and Electronics NSENSE instrument for IARPAs Rapid Analysis of Various Emerging
Created June 6, 2019