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Evgheni Strelcov (Assoc)

Research Associate

Evgheni Strelcov is a Georgetown University Faculty and NIST Associate Researcher in the Advanced Electronics Group in the Nanoscale Device Characterization Division. He received B.S. and M.S. degrees in Inorganic Chemistry from Moldova State University, Moldova, and a Ph.D. in Applied Physics from Southern Illinois University at Carbondale. His research interests include: advanced scanning probe microscopy; probing nanoscale charge transport and concurrent electrochemical and structural transformations in complex oxides; nanostructure-based metal-oxide gas sensors; nanostructure growth; complex compounds of 3d and 4f elements. Evgheni is working on developing AFM and EBIC methods for probing charge transport in wide band gap semiconductor materials and devices.

Selected Publications

  • Constraining data mining with physical models: voltage- and oxygen pressure-dependent transport in multiferroic nanostructures, E. Strelcov, A. Belianinov, Y.-H.Hsie, Y.-H. Chu and S. V. Kalinin, Nano Letters, 15 (10), 6650-6657 (2015).
  • Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale, E. Strelcov, Y. Kim, S. Jesse, I.N. Ivanov, I. Kravchenko, C.-H. Wang, Y.-C. Teng, Y.-H. Chu, and S.V. Kalinin, Nano Letters, 13, 3455-3462 (2013).
  • Gas Sensor Based on Metal−Insulator Transition in VO2 Nanowire Thermistor, E. Strelcov, Y. Lilach and A. Kolmakov, Nano Letters, 9, 2322-2326 (2009).

Publications

Probing Electrified Liquid-Solid Interfaces with Scanning Electron Microscopy

Author(s)
Hongxuan Guo, Alexander Yulaev, Evgheni Strelcov, Alexander Tselev, Christopher M. Arble, Andras Vladar, John S. Villarrubia, Andrei Kolmakov
The mean free path of secondary electrons in aqueous solutions is on the order of a nanometer, making them a suitable probe of ultrathin electrical double
Created August 31, 2019, Updated February 9, 2022