David R Black

Publications

Certification of Standard Reference Material® 640g: Line Position and Line Shape Standard for Powder Diffraction (Silicon Powder)

February 27, 2024

Author(s)

James Cline, Marcus Mendenhall, David R. Black, Albert Henins, Jack Prothero

NIST certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of the instrument performance and measurements via the

Superior Large-Scale Relaxation and Defectivity in SiGe Layers Grown on Pre-Threaded Si Substrates

October 12, 2021

Author(s)

M Erdtmann, M T. Currie, Joseph Woicik, David R. Black

State-of-the-art applications involving relaxed SiGe virtual substrates have a low tolerance for defectivity, i.e., threading dislocation density (TDD) and

Polarization Effects of X-ray Monochromators Modeled Using Dynamical Scattering Theory

July 1, 2021

Author(s)

Marcus Mendenhall, David R. Black, Donald Windover, James Cline

The difference in the diffracted intensity of the sigma-and pi-polarized components of an X-ray beam in powder diffraction has generally been treated according

The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis

July 31, 2020

Author(s)

James Cline, Marcus Mendenhall, Joseph J. Ritter, David R. Black, Albert Henins, John E. Bonevich, Pamela S. Whitfield, James J. Filliben

This rather long-standing project has resulted in a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) for the analysis of

CERTIFICATION OF SRM 640f LINE POSITION AND LINE SHAPE STANDARD FOR POWDER DIFFRACTION

May 31, 2020

Author(s)

David R. Black, Marcus Mendenhall, Albert Henins, James Filliben, James Cline

The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of

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David R Black (Fed)

Publications