David R Black

Research Interests

The development, manufacture and certification of Standard Reference Materials for the x-ray diffraction community.

Awards and Honors

U.S Department of Commerce Bronze Medal, 1998

Publications

Certification of Standard Reference Material® 640g: Line Position and Line Shape Standard for Powder Diffraction (Silicon Powder)

February 27, 2024

Author(s)

James Cline, Marcus Mendenhall, David R. Black, Albert Henins, Jack Prothero

NIST certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of the instrument performance and measurements via the

Superior Large-Scale Relaxation and Defectivity in SiGe Layers Grown on Pre-Threaded Si Substrates

October 12, 2021

Author(s)

M Erdtmann, M T. Currie, Joseph Woicik, David R. Black

State-of-the-art applications involving relaxed SiGe virtual substrates have a low tolerance for defectivity, i.e., threading dislocation density (TDD) and

Polarization Effects of X-ray Monochromators Modeled Using Dynamical Scattering Theory

July 1, 2021

Author(s)

Marcus Mendenhall, David R. Black, Donald Windover, James Cline

The difference in the diffracted intensity of the sigma-and pi-polarized components of an X-ray beam in powder diffraction has generally been treated according

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Data and Software Publications

Diffraction Data for SRM 660c

Author(s)

David Black, James Cline, Marcus Mendenhall

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a graphite

David R Black (Fed)

Publications

Data and Software Publications