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https://www.nist.gov/people/david-r-black
David R Black (Fed)
Research Interests
The development, manufacture and certification of Standard Reference Materials for the x-ray diffraction community.
Figure 1: The divergent beam x-ray powder diffractometer used to certify Standard Reference Materials.
James Cline, Marcus Mendenhall, David R. Black, Albert Henins, Jack Prothero
NIST certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of the instrument performance and measurements via the
M Erdtmann, M T. Currie, Joseph Woicik, David R. Black
State-of-the-art applications involving relaxed SiGe virtual substrates have a low tolerance for defectivity, i.e., threading dislocation density (TDD) and
Marcus Mendenhall, David R. Black, Donald Windover, James Cline
The difference in the diffracted intensity of the sigma-and pi-polarized components of an X-ray beam in powder diffraction has generally been treated according
The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a graphite