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Development and exploration of novel characterization and detector techniques for synchrotron application particularly X-ray absorption spectroscopy (XAS).
Development of combinatorial imaging and spectroscopy (spectro-microscopy) techniques in XAS (imaging XAS) to study the bulk, surface and interface structures of a wide variety of materials.
Application of XAS as well as imaging XAS to determine materials chemistry and structure-function relationships for organic electronics, photovoltaics, catalytic systems, batteries and lubrication technology.
William B. Doriese, Peter Abbamonte, Douglas A. Bennett, Edward V. Denison, Yizhi Fang, Daniel A. Fischer, Colin P. Fitzgerald, Joseph W. Fowler, Johnathon D. Gard, Gene C. Hilton, Cherno Jaye, Jessica L. McChesney, Luis Miaja Avila, Kelsey M. Morgan, Young Il Joe, Galen C. O'Neil, Carl D. Reintsema, Fanny Rodolakis, Daniel R. Schmidt, Hideyuki Tatsuno, Jens Uhlig, Leila R. Vale, Joel N. Ullom, Daniel S. Swetz
We describe a series of microcalorimeter X-ray spectrometers designed for a broad suite of measurement applications. The chief advantage of this type of
Evegeniya Lock, Dean M. DeLongchamp, Scott Schmucker, Blake Simpkins, Matthew Laskoski, Shawn Mulvaney, Daniel R. Hines, Mira Baraket, Sandra Hernandez, Jeremy Robinson, Paul Sheehan, Cherno Jaye, Daniel A. Fischer, Scott Walton
In this paper we apply a transfer print approach that relies on differential adhesion to remove graphene from Cu foil to polystyrene (PS) and ultra-high
William B. Doriese, Joseph W. Fowler, Daniel S. Swetz, Cherno Jaye, Daniel A. Fischer, Carl D. Reintsema, Douglas A. Bennett, Leila R. Vale, Gene C. Hilton, Daniel R. Schmidt, Joel N. Ullom, Jens Uhlig, Ujjwal Mandal, Galen C. O'Neil, Luis Miaja Avila, Young Il Joe, wilfrid fullagar, Fredrick P. Gustafsson, Dharma Kurunthu, Villy Sundstrom
X-ray emission spectroscopy (XES) is a powerful element-selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic