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Brian Bush (Fed)

Chemical Engineer

My research background focuses primarily on scanning probe microscopy (SPM) techniques and similar metrological measurements. I started at NIST in 2011 as an NRC Postdoc quantifying the adhesion and friction properties of self-assembled monolayers on microelectromechanical devices as a function of silane chain length. Since then, my research interests have expanded to include SPM measurements on soft and biological materials as well as other novel materials including my current research focusing quantifying interparticle forces between zinc oxide colloids for ceramic additive manufacturing applications.  Notable research highlights include:

Orcid ID: https://orcid.org/0009-0000-7904-5399

Collage AFM work
Cryo SEM images of PEG hydrogels (left) and representative load-relaxation AFM data (middle) of PEG hydrogel poroelasticity (DOI: 10.1039/c5sm01210d). AFM mechanical profiling (right) and elastic modulus measurements of mouse mammary tumor tissue ECM (DOI: 10.1016/j.biomaterials.2019.02.018).

Publications

Heterogeneity and length scale effects in PEG-based hydrogels

Author(s)
Brian G. Bush, Jenna M. Shapiro, Frank W. DelRio, Robert F. Cook, Michelle L. Oyen
Colloidal-probe spherical indentation load-relaxation experiments are conducted on poly(ethylene glycol) (PEG) hydrogel materials to quantify the steady-state
Created May 31, 2018, Updated May 5, 2023