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Bradley Alpert (Fed)

Research interests center on algorithms for scientific computation. As a numerical analyst, develops algorithms for solution of integral equations and partial differential equations. Expertise includes fast multipole methods, high-order quadrature techniques, special functions of mathematical physics, harmonic-analysis-based methods, wavelets, signal processing, and machine learning. Research applications include computational electromagnetics, including time-domain methods and nonreflecting boundary conditions.  Recent work in computational methods for thermophysical equations of state and data analysis for low-temperature superconducting transition-edge sensors.

Publications

Toward a New Primary Standardization of Radionuclide Massic Activity Using Microcalorimetry and Quantitative Milligram-Scale Samples

Author(s)
Ryan P. Fitzgerald, Bradley Alpert, Dan Becker, Denis E. Bergeron, Richard Essex, Kelsey Morgan, Svetlana Nour, Galen O'Neil, Dan Schmidt, Gordon A. Shaw, Daniel Swetz, R. Michael Verkouteren, Daikang Yan
We present a new paradigm for the primary standardization of radionuclide activity per mass of solution (Bq/g). Two key enabling capabilities are 4π decay

Absolute energies and emission line shapes of the x-ray lines of lanthanide metals

Author(s)
Joseph Fowler, Galen O'Neil, Bradley K. Alpert, Douglas Bennett, Edward V. Denison, William Doriese, Gene Hilton, Lawrence T. Hudson, Young I. Joe, Kelsey Morgan, Daniel Schmidt, Daniel Swetz, Csilla I. Szabo-Foster, Joel Ullom
We use an array of transition-edge sensors, cryogenic microcalorimeters with 4 eV energy resolution, to measure the x-ray emission-line profiles of four

Patents

X-Ray Spectrometer

X-Ray Spectrometer

NIST Inventors
Kevin L. Silverman , Carl D. Reintsema , Galen O'Neil , Luis Miaja Avila , Daniel Swetz , W.Bertrand (Randy) Doriese , Dan Schmidt , Bradley Alpert , Joseph Fowler , Joel Ullom , Ralph Jimenez and Gene C. Hilton
Patent Description Presently, there are no commercial tools for x-ray absorption and emission spectroscopy with picosecond time resolution. Additionally, there are no tabletop tools for x-ray emission spectroscopy with picosecond time resolution. Previously, x-ray emission spectroscopy with this

X-Ray Spectrometer

NIST Inventors
Joel Ullom , Galen O'Neil , Luis Miaja Avila , Kevin L. Silverman , Daniel Swetz , Ralph Jimenez , W.Bertrand (Randy) Doriese , Gene C. Hilton , Carl D. Reintsema , Dan Schmidt and Bradley Alpert
Patent Description Presently, there are no commercial tools for x-ray absorption and emission spectroscopy with picosecond time resolution. Additionally, there are no table-top tools for x-ray emission spectroscopy with picosecond time resolution. Previously, x-ray emission spectroscopy with this
Created May 31, 2018, Updated July 11, 2022