Bijal Patel, Ph.D., is an Associate Researcher within NIST's Materials Science and Engineering Division (Material Measurement Laboratory). At NIST, Bijal contributes to the Polymer Processing Group's Resonant Soft X-ray Scattering Project, helping to develop new measurement and simulation tools for exploring nanoscale structure and orientation in materials relevant to microelectronics. As part of this work, Bijal contributes to NIST-supported data analysis packages such as PyHyperScattering, and the NIST RSoXS Simulation Suite .
Prior to NIST, Bijal's research career touched on additive manufacturing of optical and electronic polymers, atomic layer deposition for high-k dielectrics (microelectronics), development of nanostructured electrocatalysts for water splitting, and development of new lithium-ion battery electrode materials. Ongoing interests are in the areas of polymers, nanotechnology, metrology, energy, and microelectronics.