The method addresses the need to characterize single-photon detectors whose jitter is in the few-picosecond range.
This is a simple method to measure the jitter, or temporal variation, of a repeated event. The method is based on simple electronic circuitry and can achieve measurement resolution on the order of hundreds of femtoseconds.
There are a variety of technologies and methodologies used for event timing. This measurement suggests that this method can provide better temporal resolution for characterizing the temporal distribution of repeated periodic events.
The invention is a method to characterize the temporal variation, or “jitter,” of a single-photon detector’s response with high accuracy.