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Temporal Jitter Analyzer And Analyzing Temporal Jitter

Patent Number: 11,567,127

Problem

This circuit measures the timing jitter, or variation, in the arrival time of a repetitive electrical signal of interest, such as from the output of a single-photon detector under short-pulse illumination. An ultra-low jitter clock that is synchronous with the repetition rate of the input signal is slowly swept in time (by some external means of phase delay) with respect to the input signal.

The method addresses the need to characterize single-photon detectors whose jitter is in the few-picosecond range.

Invention

This is a simple method to measure the jitter, or temporal variation, of a repeated event. The method is based on simple electronic circuitry and can achieve measurement resolution on the order of hundreds of femtoseconds. 

Potential Commercial Applications

There are a variety of technologies and methodologies used for event timing. This measurement suggests that this method can provide better temporal resolution for characterizing the temporal distribution of repeated periodic events. 

Competitive Advantage

The invention is a method to characterize the temporal variation, or “jitter,” of a single-photon detector’s response with high accuracy.

Created March 10, 2023, Updated September 17, 2025
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