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Search Patents by Dave McColskey

Patents listed here reflect only technologies patented from FY 2018-present. To view all of NIST's patented technologies, visit the NIST pages on the Federal Laboratory Consortium website.

Displaying 1 - 1 of 1

Multiple Specimen Testing

NIST Inventors
Dave McColskey and Andrew Slifka
Systems and methods are described for concurrently applying loads to multiple test specimens. The systems and methods are useful for cyclical tensile loading of specimens such as in fatigue strength evaluations. The systems and methods are also useful for low frequency cyclical loading evaluations.