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Search Patents by Edward Garboczi

Patents listed here reflect only technologies patented from FY 2018-present. To view all of NIST's patented technologies, visit the NIST pages on the Federal Laboratory Consortium website.

Displaying 1 - 2 of 2

Scanning Microwave Ellipsometer And Performing Scanning Microwave Ellipsometry

NIST Inventors
Chris Long , Nate Orloff and Edward Garboczi
New strong, light, and compact formed carbon fiber components require shorter, higher-aspect ratio carbon fibers. Shorter carbon fibers must be aligned to realize the desired tensile strength. Before this invention, industry lacked a tool to characterize carbon fiber alignment for inline quality

Scanning Microwave Ellipsometer And Performing Scanning Microwave Ellipsometry

NIST Inventors
Chris Long , Nate Orloff and Edward Garboczi
A scanning microwave ellipsometer includes: a microwave ellipsometry test head including: a polarization controller; a transmission line; and a sensor that produces sensor microwave radiation, subjects a sample to the sensor microwave radiation, receives a sample reflected microwave radiation from