NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Leakage Effects in Microwave Power Measurements

Published

Author(s)

Ronald A. Ginley, Denis X. LeGolvan, Ann F. Monke

Abstract

Because microwave power measurements are used to support almost every segment of the microwave electronics industry, the accuracy of these measurements is critical. Recently, we have several different problems that affect microwave power measurements which include leakage, compensation bead bias conditions, and common mode noise. One of the main problems is leakage of microwave energy through the microwave power sensors. This paper explores some of the effects this leakage energy has on different parts of microwave power measurements systems and the power measurement process and discusses possible ways of handling the errors associated with energy.
Citation
NCSL International Measure
Pub Type
Journals

Keywords

effective efficiency, leakage, microwavepower, reflection coefficient
Metrology

Citation

Ginley, R. , LeGolvan, D. and Monke, A. (2007), Leakage Effects in Microwave Power Measurements, NCSL International Measure (Accessed October 13, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 26, 2007, Updated January 27, 2020
Was this page helpful?