Simple Test and Modeling of RFID Tag Backscatter

Published

July 1, 2012

Author(s)

Daniel G. Kuester, David R. Novotny, Jeffrey R. Guerrieri, Aniwar Ibrahim, Zoya Popovic

Abstract

We consider here worst-case analysis of backscatter from passive radio frequency identification (RFID) tags. The basis is a figure of merit "B" to relate link power at reader ports to tag circuit parameters. A minimum bound for received monostatic backscatter can be determined by inspection from measured. The bound is general for narrowband signals in any causal linear propagation. For an assembled tag, this minimum varies only with reader transmit power, tag antenna tuning, and chip power sensitivity of different commands. To validate this model, we propose a backscatter calibration device to enable measurements with estimated 0.5 dB uncertainty. We then demonstrate how the minimum bound can inform reader sensitivity specification to help ensure reliable inventory performance.

Citation

IEEE Transactions on Microwave Theory and Techniques

Volume

60

Issue

7

Pub Type

Journals

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DOI Link

Keywords

Backscatter, power harvesting, radio frequency identification (RFID), ultrahigh frequency (UHF)

Citation

Kuester, D. , Novotny, D. , Guerrieri, J. , Ibrahim, A. and Popovic, Z. (2012), Simple Test and Modeling of RFID Tag Backscatter, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TMTT.2012.2195017 (Accessed October 8, 2025)