Comparison of Power Ratio and Vector Network Analyzer Techniques for Measuring Attenuation

Published

November 30, 2012

Author(s)

Caitlin Chirgwin, Thomas P. Crowley, Weihai Fang, Denis X. LeGolvan

Abstract

By using a power ratio technique, we have lowered our uncertainty for attenuation measurements by a factor of about 4 (typical) when compared to our vector network analyzer uncertainty analysis. The power ratio technique is applicable to insertable 2-port devices with low reflection coefficients such as airlines and attenuators. The method is illustrated with 3 coaxial devices over a frequency range of 2-18 GHz and 2 rectangular waveguide devices over a frequency range of 50-75 GHz. Our results suggest that a significantly lower attenuation uncertainty could be justified by a re-analysis of the vector network analyzer measurements.

Proceedings Title

Proceedings of the 80th Automatic Radio Frequency Techniques Group (ARFTG) Microwave Measurement Conference

Conference Dates

November 29-30, 2012

Conference Location

San Diego, CA, US

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/ARFTG.2012.6422438

Local Download

Keywords

scattering parameters, vector network analyzer, microwave measurements, microwave power

Citation

Chirgwin, C. , Crowley, T. , Fang, W. and LeGolvan, D. (2012), Comparison of Power Ratio and Vector Network Analyzer Techniques for Measuring Attenuation, Proceedings of the 80th Automatic Radio Frequency Techniques Group (ARFTG) Microwave Measurement Conference, San Diego, CA, US, [online], https://doi.org/10.1109/ARFTG.2012.6422438, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=912694 (Accessed October 21, 2025)