A Low Noise Latching Comparator Probe for Waverform Sampling Applications

Published

May 1, 2002

Author(s)

David I. Bergman, Bryan C. Waltrip

Abstract

A new latching comparator probe is described. The probe is being developed as part of an effort to extend voltage measurement capability in the 10 Hz to 1 MHz frequency range. The probe offers an input voltage range of ±10V, input impedance of 1 MΩ}, and noise referred to the input as low as 55 υV rms. The probe's 3 dB bandwidth is approximately 20 MHz. Total harmonic distortion is as low as -93 dB at 50 kHz. Gain flatness is within ±10 ppm from 100 Hz to 100 kHz. Improved step settling performance is achieved using a technique that minimizes circuit thermal errors. A frequency compensated, 1 MΩ} input impedance, 22:1 attenuator is further compensated with a digital filtering algorithm allowing 100 V pk pulses in the microsecond regime to be measured with 100 ppm accuracy.

Citation

IEEE Transactions on Instrumentation and Measurement

Volume

52

Issue

4

Pub Type

Journals

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Keywords

comparator, frequency compensation, signal sampling, successive approximation

Citation

Bergman, D. and Waltrip, B. (2002), A Low Noise Latching Comparator Probe for Waverform Sampling Applications, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33117 (Accessed October 12, 2025)