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PUBLICATIONS

Calibrated Measurement of Optoelectronic Frequency Response

Published

Author(s)

Paul D. Hale, Dylan Williams

Abstract

We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.
Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
51
Issue
4
Pub Type
Journals

Download Paper

DOI Link

Keywords

frequency response, measurement, optoelectronic devices, scattering matrices

Citation

Hale, P. and Williams, D. (2003), Calibrated Measurement of Optoelectronic Frequency Response, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TMTT.2003.809186 (Accessed October 20, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created March 31, 2003, Updated October 12, 2021
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