Hale, P.
and Williams, D.
(2003),
Calibrated Measurement of Optoelectronic Frequency Response, IEEE Transactions on Microwave Theory and Techniques, [online], https://doi.org/10.1109/TMTT.2003.809186 (Accessed April 28, 2026)
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Calibrated Measurement of Optoelectronic Frequency Response
Published
Author(s)
,
Abstract
We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.Citation
IEEE Transactions on Microwave Theory and Techniques
Volume
51
Issue
4
Pub Type
Journals
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Keywords
frequency response, measurement, optoelectronic devices, scattering matrices
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Created March 31, 2003, Updated October 12, 2021