Postek, M.
(1989),
Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard, Scanning Microscopy
(Accessed July 22, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard
Published
Author(s)
Citation
Scanning Microscopy
Volume
3
Issue
4
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 31, 1989, Updated February 17, 2017