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PUBLICATIONS

Interface Roughness Studies of AlAs/GaAs Superlattices Using X-Ray Diffraction

Published

Author(s)

S. B. Qadri, Joseph G. Pellegrino
Proceedings Title
Extended Abstract, Annual Report, National Synchrotron Light Source Proceedings
Conference Location
Upton, NY, USA
Pub Type
Conferences

Citation

Qadri, S. and Pellegrino, J. (1992), Interface Roughness Studies of AlAs/GaAs Superlattices Using X-Ray Diffraction, Extended Abstract, Annual Report, National Synchrotron Light Source Proceedings, Upton, NY, USA (Accessed October 22, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1992, Updated October 12, 2021
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