Models for Interpreting Measurements Scanning Capacitance Microscope Measurements

Jay F. Marchiando; J R. Lowney; Joseph Kopanski

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Models for Interpreting Measurements Scanning Capacitance Microscope Measurements

Published

December 31, 1997

Author(s)

Jay F. Marchiando, J R. Lowney, Joseph Kopanski

Citation

Scanning Microscopy

Volume

Issue

Pub Type

Journals

Citation

Marchiando, J. , Lowney, J. and Kopanski, J. (1997), Models for Interpreting Measurements Scanning Capacitance Microscope Measurements, Scanning Microscopy (Accessed April 24, 2026)

Additional citation formats

Google Scholar
BibTeX
RIS

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1997, Updated October 12, 2021

Was this page helpful?