Mayo, S.
, Lowney, J.
and Roitman, P.
(1991),
Measurement of Interface Defects in Gated SIMOX Structures, Proc., 1991 IEEE International SOI Conference, Vail Valley, CO, USA
(Accessed August 31, 2025)
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Measurement of Interface Defects in Gated SIMOX Structures
Published
Author(s)
, ,
Proceedings Title
Proc., 1991 IEEE International SOI Conference
Conference Dates
October 1-3, 1991
Conference Location
Vail Valley, CO, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 30, 1991, Updated October 12, 2021