Postek, M.
, Keery, W.
and Larrabee, R.
(1989),
Specimen Biasing to Enhance or Suppress Secondary Electron Emission from Charging Specimens at Low Accelerating Voltages, Scanning Microscopy (Accessed June 21, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Specimen Biasing to Enhance or Suppress Secondary Electron Emission from Charging Specimens at Low Accelerating Voltages
Published
Author(s)
, ,
Citation
Scanning Microscopy
Volume
11
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 30, 1989, Updated October 12, 2021