Oettinger, F.
and Blackburn, D.
(1990),
Semiconductor Measurement Technology: Thermal Resistance Measurements, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed December 7, 2025)
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Semiconductor Measurement Technology: Thermal Resistance Measurements
Published
Author(s)
,
Citation
Special Publication (NIST SP) -
Volume
400
Issue
86
NIST Pub Series
Pub Type
NIST Pubs
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created June 30, 1990, Updated October 12, 2021