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PUBLICATIONS

Electron Traps, Structural Change, and Hydrogen-Related SIMOX Defects

Published

Author(s)

J. F. Conley, Patrick M. Lenahan, Peter Roitman
Proceedings Title
Proc., IEEE International SOI Conference
Conference Dates
October 6-8, 1992
Conference Location
Ponte Vedra Beach, FL, USA
Pub Type
Conferences

Citation

Conley, J. , Lenahan, P. and Roitman, P. (1992), Electron Traps, Structural Change, and Hydrogen-Related SIMOX Defects, Proc., IEEE International SOI Conference, Ponte Vedra Beach, FL, USA (Accessed October 17, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1992, Updated October 12, 2021
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