Postek, M.
(1987),
Resolution and Measurement in the Scanning Electron Microscope, Proc., 45th Annual Meeting, Electron Microscope Society of America, Boston, MA
(Accessed July 30, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Resolution and Measurement in the Scanning Electron Microscope
Published
Author(s)
Proceedings Title
Proc., 45th Annual Meeting, Electron Microscope Society of America
Conference Location
Boston, MA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 31, 1987, Updated February 17, 2017