Improved Capacitance Measurements with Respect to a 1 pF Cross Capacitor from 200 Hz to 2000 Hz

Published

April 1, 2005

Author(s)

Yicheng Wang, Scott H. Shields

Abstract

We describe frequency dependence measurements of fused-silica capacitance standards from 200 Hz to 2000 Hz, using a 1 pF cross capacitor as the reference. Frequency dependence of fused-silica capacitors varies significantly, ranging from a change of less than 0.2x10-6 for one standard to a net change of 0.8x10-6 for another over the frequency range. Overall increasing capacitances with decreasing frequency from 1592Hz for all tested fused-silica capacitors indicates that dielectric relaxation due to dielectric bulk and/or interfacial defects is the dominant source of frequency dependence. The relative combined standard uncertainty at 200 Hz (the largest in the frequency range) is 0.07'10-6, which is smaller by about a factor of three than the uncertainty reported earlier from NIST.

Citation

IEEE Transactions on Instrumentation and Measurement

Pub Type

Journals

Keywords

Capacitance, cross capacitor, farad, frequency dependence., fused-silica capacitor

Citation

Wang, Y. and Shields, S. (2005), Improved Capacitance Measurements with Respect to a 1 pF Cross Capacitor from 200 Hz to 2000 Hz, IEEE Transactions on Instrumentation and Measurement (Accessed October 11, 2025)