Harris, R.
(2003),
Cryogenic Electronics for Measurements and Standards, Ext. Abstracts, 2003 Intl. Superconductive Electronics Conf. (ISEC), Sydney, AS
(Accessed May 1, 2025)
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Cryogenic Electronics for Measurements and Standards
Published
Author(s)
Abstract
A wide range of applications of cryogenic electronics to measurements and standards is described. Standards include those for voltage, capacitance and current, resistance and temperature. Measurements include those for imaging of radiation from the infrared through x-rays.Proceedings Title
Ext. Abstracts, 2003 Intl. Superconductive Electronics Conf. (ISEC)
Conference Dates
July 7-11, 2003
Conference Location
Sydney, AS
Pub Type
Conferences
Keywords
cryogenic, electronics, measurement standards, superconductivity
Citation
Issues
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Created July 11, 2003, Updated January 27, 2020