Gajewski, D.
and Guyer, J.
(2000),
In Situ Spectroscopic Ellipsometry of Low-Temperature-Grown GaAs, Applied Physics Letters (Accessed May 8, 2026)
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In Situ Spectroscopic Ellipsometry of Low-Temperature-Grown GaAs
Published
Author(s)
Donald A. Gajewski,
Citation
Applied Physics Letters
Pub Type
Journals
Citation
Issues
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Created July 23, 2000, Updated October 12, 2021