Conley, J.
, Lenahan, P.
and Roitman, P.
(1992),
Evidence for Structural Change and a Deep Electron Trap in Separation by Implanted Oxygen Oxides, IEEE Transactions on Nuclear Science
(Accessed April 30, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Evidence for Structural Change and a Deep Electron Trap in Separation by Implanted Oxygen Oxides
Published
Author(s)
J. F. Conley, Patrick M. Lenahan,
Citation
IEEE Transactions on Nuclear Science
Volume
NS-39
Issue
6
Pub Type
Journals
Citation
Created November 30, 1992, Updated October 12, 2021