Kopanski, J.
(2003),
Scanning Probe Microscopes for the Electrical Characterization of Semiconductors, Bulletin of the American Physical Society
(Accessed December 14, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Scanning Probe Microscopes for the Electrical Characterization of Semiconductors
Published
Author(s)
Citation
Bulletin of the American Physical Society
Pub Type
Others
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created March 4, 2003, Updated January 27, 2020