Pratt, J.
, Newell, D.
, Williams, E.
, Smith, D.
and Kramar, J.
(2001),
Towards a Traceable Nanoscale Force Standard, Proceedings of the EUSPEN International Conference, Turin, IT (Accessed August 6, 2026)
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Towards a Traceable Nanoscale Force Standard
Published
Author(s)
, , , ,
Abstract
The National Institute of Standards and Technology has launched a five-year project to traceably link the International System of Units (SI) to forces between 10-8N and 10-2N. In this paper, we give a background and overview of this project, discuss the electrostatic realization and dissemination of force through a mechanical balance, and provide a brief summary of the Microforce Laboratory being constructed at NIST.Conference Dates
May 27-31, 2001
Conference Location
Turin, IT
Conference Title
Proceedings of the EUSPEN International Conference
Pub Type
Conferences
Keywords
AFM, force, measurement, MEM's, nanoindentation
Citation
Issues
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Created May 1, 2001, Updated February 19, 2017