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PUBLICATIONS

Pixel Based Absolute Topography Test for Three Flats

Published

Author(s)

R E. Parks, Lianzhen Shao, Christopher J. Evans

Abstract

We demonstrate a new method of performing the absolute three flat test using reflection symmetries of the surfaces and an algorithm for generating the rotation of arrays of pixel data. Most of the operations involve left/right and top/bottom flips of data arrays, operations that are very fast on most frame grabbers and are available on most commercial phase measuring interferometers. We demonstrate the method with simulated data as well as with actual data from 150 mm diameter surfaces that are flat to better than 25 nm peak-to-valley.
Citation
Applied Optics
Volume
37(25)
Pub Type
Journals

Keywords

absolute testing, interferometry, optical testing, surface metrology, three-flat test
Metrology and Manufacturing

Citation

Parks, R. , Shao, L. and Evans, C. (1998), Pixel Based Absolute Topography Test for Three Flats, Applied Optics (Accessed October 11, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 31, 1997, Updated October 12, 2021
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