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PUBLICATIONS

Tip Characterization for Dimensional Nanometrology

Published

Author(s)

John S. Villarrubia

Abstract

Technological trends are increasingly requiring dimensional metrology at size scales below a micrometer. Scanning probe microscopy has unique advantages in this size regime, but width and roughness measurements must be corrected for imaging artifacts. This chapter aims to acquaint the reader with important measurement issues associated with the finite size of SPM tips and to make accessible in practical form recent advances in tip and sample reconstruction techniques. To that end, in addition to a general introduction to the ideas, references are given to computer codes, and recipes or procedures for the application of those codes to typical measurements.
Citation
Chapter in: Industrial SXM Techniques
Publisher Info
Springer-Verlag, Berlin Heidelberg, New York, NY
Pub Type
Books

Keywords

atomic force microscopy, blind reconstruction, dilation, erosion, scanning probe microscopy, scanning tunneling microscopy, tip artifacts, tip estimation
Manufacturing and Metrology

Citation

Villarrubia, J. (1999), Tip Characterization for Dimensional Nanometrology, Springer-Verlag, Berlin Heidelberg, New York, NY (Accessed October 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 1999, Updated February 19, 2017
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