Small, J.
, Newbury, D.
, Scott, J.
, King, L.
, Nam, S.
, Irwin, K.
, Deiker, S.
, Barkan, S.
and Iwaniczko, E.
(2002),
A Well Dressed Microscope: Practical Experience With Microcalorimeter and Silicon Drift Detector Systems, Microscopy and Microanalysis
(Accessed October 8, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A Well Dressed Microscope: Practical Experience With Microcalorimeter and Silicon Drift Detector Systems
Published
Author(s)
, , J H. Scott, L R. King, , , , S Barkan, E Iwaniczko
Abstract
NIST, Gaithersburg has recently installed a first generation silicon drift dectector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer ( cal-EDS) on a JEOL 840 SEM1 , as shown in Fig.1. [1,2] The instrument is also equipped with a conventional Si-Li x-ray detector (LINK ISIS 3 position turret) and a JEOL wavelength dispersive x-ray spectrometer. NIST, Gaithersburg staff have had the opportunity to work with these new detector tecnologies as users and to compare preliminary results with conventional systems.Citation
Microscopy and Microanalysis
Volume
8
Issue
Suppl. 2
Pub Type
Journals
Keywords
instrument, JEOL wavelength dispersive x-ray spectro, microcalorimeter, silcon drift detector systems
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 1, 2002, Updated February 17, 2017