Migdall, A.
(1999),
Correlated Photon Based Metrology Without Absolute Standards, Physics Today, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841318
(Accessed April 20, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Correlated Photon Based Metrology Without Absolute Standards
Published
Author(s)
Abstract
Pairs of photons produced two at a time via optical parametric down-conversion have proved to be a useful tool for metrology. The status of three such applications is presented. One common theme through each of these applications is that they offer absolute results without any externally calibrated standards.Citation
Physics Today
Pub Type
Journals
Download Paper
Keywords
correlated photon, down-conversion, metrology, polarization mode dispersion, quantum efficiency, radiance
Citation
Created January 1, 1999, Updated February 17, 2017