NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

NIST Program for the Infrared Emittance Characterization of Materials for Thermal Conductivity29/Thermal Expansion 17

Published

Author(s)

Leonard M. Hanssen, Sergey Mekhontsev, Simon G. Kaplan

Abstract

Over the past decade and a half, the National Institute of Standards and Technology (NIST) has established measurement capabilities for the characterization of the spectral emittance of material samples in the infrared spectral range of 1 to 20 microns. These capabilities are available to both internal and external customers. These capabilities are part of the Infrared Optical Properties Measurement Program and are located at the Fourier Transform Infrared Spectrophotometry (FTIS) Facility at NIST. Instrumentation has been developed for the characterization of sample emittance as a function of wavelength, temperature and angle. Both direct and indirect techniques of determining emittance are employed: an integrating sphere based method for samples at temperatures below 200 C and a radiance comparison method for temperatures up to 1000 C. The measurement systems and methods, as well as examples of sample emissivity results, including Pt10%Rh and SiC are reported.
Proceedings Title
Proceedings of the International Thermal Conductivity Conference | 2007 |
Conference Dates
June 24-27, 2007
Conference Title
International Thermal Conductivity Conference
Pub Type
Conferences

Citation

Hanssen, L. , Mekhontsev, S. and Kaplan, S. (2007), NIST Program for the Infrared Emittance Characterization of Materials for Thermal Conductivity29/Thermal Expansion 17, Proceedings of the International Thermal Conductivity Conference | 2007 | (Accessed October 27, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created June 27, 2007, Updated June 13, 2017
Was this page helpful?