Precision Wavelength Metrology with a Fourier Transform Spectrometer

Published

June 1, 2003

Author(s)

D. Veza, Marc L. Salit, John C. Travis, Craig J. Sansonetti

Abstract

We have investigated the intrinsic accuracy of the optical frequency scale in spectra acquired by a Fourier Transform Spectrometer (FTS). The uncalibrated accuracy of the FTS optical frequency axis is about 1 part in 10⁵. This uncertainty can be reduced by at least two orders of magnitude using a multiplicative calibration correction derived from a single wavelength standard line. The work reported here describes a new approach to accurate calibration of the wavenumber scale for a UV-visible FTS, which we have used to measure accurate wavenumbers and Ar pressure shifts for the prominent lines of ¹⁹⁸Hg.

Proceedings Title

IMEKO World Congress, Metrology in the 3rd Millennium | XVII | |

Conference Dates

June 22-27, 2003

Conference Location

Cavtat-Dubrovnik, 1, CR

Conference Title

IMEKO World Congress

Pub Type

Conferences

Keywords

fourier transform spectrometer, Hg, pressure shift, wavenumber calibration

Citation

Veza, D. , Salit, M. , Travis, J. and Sansonetti, C. (2003), Precision Wavelength Metrology with a Fourier Transform Spectrometer, IMEKO World Congress, Metrology in the 3rd Millennium | XVII | |, Cavtat-Dubrovnik, 1, CR (Accessed October 21, 2025)