Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

First-Principles Ultraviolet and X-Ray Spectra Over Broad Ranges

Published

Author(s)

Eric L. Shirley, J A. Soininen, J J. Rehr
Proceedings Title
Optical Constants of Materials for UV to X-Ray Wavelengths
Volume
5538
Issue
No 1
Conference Dates
August 4-5, 2004
Conference Title
Proceedings of SPIE--the International Society for Optical Engineering

Keywords

BeO, Bethe-Salpeter, first-principles, LiF, MgO, optical constants, Si, x-ray absorption spectrum

Citation

Shirley, E. , Soininen, J. and Rehr, J. (2004), First-Principles Ultraviolet and X-Ray Spectra Over Broad Ranges, Optical Constants of Materials for UV to X-Ray Wavelengths (Accessed October 27, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created August 1, 2004, Updated February 17, 2017
Was this page helpful?