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Microcalorimeter/EBIT Measurements of X-Ray Spectra of Highly Charged Ions
Published
Author(s)
I Kink, J M. Laming, E Takacs, James V. Porto, John D. Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, M Barbera, N Brickhouse, S Murray, D Landis, J. Beeman, E. E. Haller
Abstract
Spectra of highly charged Ar, Kr, Xe and Fe ions, produced in an Electron Beam Ion Trap (EBIT), have been recorded in a broad x-ray energy band (0.2 keV to 10 keV) with a microcalorimeter detector. The first analysis of the Kr spectra has been completed and most of the spectral lines have been identified as transitions of B- to Al-like Kr. The transition energies have been determined with 0.2 % uncertainty. Asemi-empirical EBIT plasma model has been created to calculate a synthetic spectrum of highly charged Kr and to determine a charge state distribution of Kr ions inside the EBIT. Line intensity ratios of Fe XVII have been measured and compared with theoretical models.32.30.Rj, 34.50.Fa, 34.80.Dp, 32.70.Fw
Kink, I.
, Laming, J.
, Takacs, E.
, Porto, J.
, Gillaspy, J.
, Silver, E.
, Schnopper, H.
, Bandler, S.
, Barbera, M.
, Brickhouse, N.
, Murray, S.
, Landis, D.
, Beeman, J.
and Haller, E.
(2001),
Microcalorimeter/EBIT Measurements of X-Ray Spectra of Highly Charged Ions, Physica Scripta
(Accessed October 10, 2025)