Microcalorimeter/EBIT Measurements of X-Ray Spectra of Highly Charged Ions

Published

January 1, 2001

Author(s)

I Kink, J M. Laming, E Takacs, James V. Porto, John D. Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, M Barbera, N Brickhouse, S Murray, D Landis, J. Beeman, E. E. Haller

Abstract

Spectra of highly charged Ar, Kr, Xe and Fe ions, produced in an Electron Beam Ion Trap (EBIT), have been recorded in a broad x-ray energy band (0.2 keV to 10 keV) with a microcalorimeter detector. The first analysis of the Kr spectra has been completed and most of the spectral lines have been identified as transitions of B- to Al-like Kr. The transition energies have been determined with 0.2 % uncertainty. Asemi-empirical EBIT plasma model has been created to calculate a synthetic spectrum of highly charged Kr and to determine a charge state distribution of Kr ions inside the EBIT. Line intensity ratios of Fe XVII have been measured and compared with theoretical models.32.30.Rj, 34.50.Fa, 34.80.Dp, 32.70.Fw

Citation

Physica Scripta

Volume

%92

Pub Type

Journals

Keywords

EBIT, highly charged ions, microcalorimeter, x-ray spectra

Citation

Kink, I. , Laming, J. , Takacs, E. , Porto, J. , Gillaspy, J. , Silver, E. , Schnopper, H. , Bandler, S. , Barbera, M. , Brickhouse, N. , Murray, S. , Landis, D. , Beeman, J. and Haller, E. (2001), Microcalorimeter/EBIT Measurements of X-Ray Spectra of Highly Charged Ions, Physica Scripta (Accessed October 10, 2025)