Comparison of Near-Infrared Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers

Published

April 1, 2002

Author(s)

James J. Butler, H Park, P Y. Barnes, E A. Early, C van Eijk-Olij, A E. Zoutman, S van Buller-Leeuwen, J G. Schaarsberg

Abstract

A spectrophotometer based on an integrating sphere coupled to a commercial FTIR instrument has been constructed for regular spectral transmittance and reflectance measurements over the 1 m to 18 m wavelength region. Despite the large number of error sources which often limit the photometric accuracy of FTIR measurements, we demonstrate uncertainties on a par with established dispersive instrumentation. We performed near-normal incidence reflectance and transmittance measurements on a series of samples over the 1 m to 2.5 m wavelength range using both FTIR and dispersive spectrophotometers. The results are compared, taking into account any differences in measurement geometry among the various systems, and the combined measurement uncertainty.

Citation

Metrologia

Volume

39

Issue

No. 2

Pub Type

Journals

Keywords

Fourier transform infrared spectrometer, infrared, reflectance, standard reference material, transmittance

Citation

Butler, J. , Park, H. , Barnes, P. , Early, E. , van Eijk-Olij, C. , Zoutman, A. , van Buller-Leeuwen, S. and Schaarsberg, J. (2002), Comparison of Near-Infrared Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers, Metrologia (Accessed October 15, 2025)