NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Improved Facility for Optical Detector Characterization
Published
Author(s)
T Flournoy, George P. Eppeldauer
Abstract
The detector characterization and calibration facility of the Army Primary Standards Laboratory (APSL) has been extended. In addition to the traditional filter and monochromator based spectral measurements, laser-based sphere sources and high performance irradiance meters have been developed to extend the spectral coverage and signal dynamic range of detector and radiometer calibrations. The modulation of the laser sources provides a platform for extending the dynamic range of frequency dependent responsivity testing. The newly developed high accuracy radiometer standards make it possible to perform spectral power and irradiance responsivity measurements with an expanded uncertainty (k=2)1 of 0.5% or smaller.
Proceedings Title
NCSL International 2003 Workshop and Symposium Conference Proceedings | | The Spectrum of Metrology: From the State of the Art to the Everyday |
Conference Dates
August 17-21, 2003
Conference Location
Undefined
Conference Title
National Conference of Standards Laboratories International
Flournoy, T.
and Eppeldauer, G.
(2021),
Improved Facility for Optical Detector Characterization, NCSL International 2003 Workshop and Symposium Conference Proceedings | | The Spectrum of Metrology: From the State of the Art to the Everyday |, Undefined
(Accessed October 10, 2025)