Fabrication and Characterization of In-Situ Grown Epitaxial Ba1-xSrxTi03) Composition Spreads

Published

July 1, 2002

Author(s)

K S. Chang, M A. Aronova, O Famodu, Jason Hattrick-Simpers, S E. Lofland, Ichiro Takeuchi, C J. Lu, Leonid A. Bendersky, H C. Chang

Abstract

We have used our combinatorial pulsed laser deposition system to in-situ fabricate epitaxial Ba(sub1-x)Sr(sub x)Ti)(sub 3) thin film composition spreads on (100) LaAl0(sub3) substrates. Multimode quantitative microwave microscopy was used to perform dielectric chacterization of the spreads at multiple microwave frequencies simultaneously. Systematic variation in dielectric properties as a function of composition is studied. The multi-mode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric dispersion in Ba(sub 1-x)Sr(sub x)Ti0(sub3).

Proceedings Title

Combinatorial and Artificial Intelligence Methods in Materials Science, Symposium S | | | Materials Research Society

Volume

700

Conference Dates

November 1, 2001

Conference Location

Undefined

Conference Title

Materials Research Society Symposium Proceedings

Pub Type

Conferences

Keywords

Ba-Sr-Ti-0, characterization, combinatorial methods, dielectrics

Citation

Chang, K. , Aronova, M. , Famodu, O. , Hattrick-Simpers, J. , Lofland, S. , Takeuchi, I. , Lu, C. , Bendersky, L. and Chang, H. (2002), Fabrication and Characterization of In-Situ Grown Epitaxial Ba_1-xSr_xTi0₃) Composition Spreads, Combinatorial and Artificial Intelligence Methods in Materials Science, Symposium S | | | Materials Research Society, Undefined (Accessed October 10, 2025)