Elastic Strain and Stress Determination by Rietveld Refinement: Generalized Treatment for Textured Polycrystals for all Laue Classes

Published

April 1, 2001

Author(s)

N Popa, Davor Balzar

Abstract

We propose a novel approach to model diffraction peak shifts caused by residual or applied stresses in textured polycrystals. The models yields the complete strain and stress tensors as a function of crystallite orientation, as well as the average values of macroscopic strain and stress tensors. It is particularly suitable for introduction in Rietveld-refinement programs. We give the requirements on refinable parameters for all crystal Laue classes. The effects of sample symmetry are also included and conditions for strain invariance to both symmetries are discussed.

Citation

Journal of Applied Crystallography

Volume

34

Issue

Part 2

Pub Type

Journals

Keywords

diffraction, rietveld refinement, strain, stress, texture

Citation

Popa, N. and Balzar, D. (2001), Elastic Strain and Stress Determination by Rietveld Refinement: Generalized Treatment for Textured Polycrystals for all Laue Classes, Journal of Applied Crystallography (Accessed May 16, 2026)

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