DeLongchamp, D.
, Sambasivan, S.
, Fischer, D.
, Lin, E.
and Vogel, B.
(2008),
Measuring Structure and Order Development in Organic Semiconductor Films Using Soft X-Ray Spectroscopy, Aiche Journal (Accessed May 15, 2026)
If you have any questions about this publication or are having problems accessing it, please contact [email protected].