Sharpe, W.
, Jadaan, O.
, Beheim, G.
, Quinn, G.
and Nemeth, N.
(2005),
Fracture Strength of Silicon Carbide Microspecimens, Journal of Micromechanics and Microengineering
(Accessed May 1, 2025)
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Fracture Strength of Silicon Carbide Microspecimens
Published
Author(s)
W N. Sharpe, O Jadaan, G M. Beheim, , N N. Nemeth
Abstract
Micro silicon carbide tension specimen were prepared with straight, curved, and notched gage lengths. These were tested to failure and the strengths analyzed by Weibull statistics. Fractographic analysis confirmed that strength limiting flaws were etch grooves associated with large, favorably oriented SiC grains.Citation
Journal of Micromechanics and Microengineering
Volume
14
Issue
No. 5
Pub Type
Journals
Keywords
chemical vapor deposition, fractography, silicon carbide, tension strength, weibull distribution
Citation
Issues
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Created September 30, 2005, Updated October 12, 2021