Rapid Structural and Chemical Characterization of Ternary Phase Diagrams Using Synchrotron Radiation

Published

October 1, 2003

Author(s)

Eliot D. Specht, A Rar, George M. Pharr, E P. George, P Zschack, H Hong, J Ilavsky

Abstract

The complete ternary Cr-Fe-Ni system is grown on A12O3(0001) substrates by sequential deposition of layers of graded thickness followed by annealing to interdiffuse the elements. The phase diagram is measured at a resolution of 3 atomic % in 2 h at a resolution of 2 atomic % by rastering the sample under a focused beam of synchrotron radiation while simultaneously measuring the diffraction pattern with a CCD detector to determine crystallographic phase, texture, and lattice parameters and measuring the x-ray fluorescence with an energy-dispersive detector to determine elemental composition. Maps of phase composition and lattice parameter as a function of composition for several annealing treatments are found to be consistent with equilibrium values.

Citation

Journal of Materials Research

Volume

18

Issue

No. 10

Pub Type

Journals

Keywords

combinational analysis, Cr-Fe-Ni layers, phase composition, synchrotron x-ray diffraction, ternary phase diagram

Citation

Specht, E. , Rar, A. , Pharr, G. , George, E. , Zschack, P. , Hong, H. and Ilavsky, J. (2003), Rapid Structural and Chemical Characterization of Ternary Phase Diagrams Using Synchrotron Radiation, Journal of Materials Research (Accessed October 17, 2025)