Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

On-Line Process Control

Published

Author(s)

Raghu N. Kacker, Nien-Fan Zhang

Abstract

The natural state of manufacturing and measurement processes is usually nonstationary. The methods of statistical process control (SPC) are therefore inappropriate for on-line control. This paper provides a simple and generic protocol for on-line control that is based on the integrated moving average model of errors. The ideal parameters of the protocol are those which balance the economic benefit against the cost of on-line control. We provide explicit formulas for the ideal parameters as functions of the relevant engineering economic and statistical parameters.
Citation
Technometrics

Keywords

Industrial Engineering, production systems, Statistical process control

Citation

Kacker, R. and Zhang, N. (2008), On-Line Process Control, Technometrics (Accessed October 1, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created October 16, 2008
Was this page helpful?