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PUBLICATIONS

Overview for Special Issue of Standard View

Published

Author(s)

S A. Wakid, Shirley M. Radack

Abstract

This article introduces a Special Issue of StandardView, in which some of the critical measurement issues that challenge the information technology community are explored. A series of papers are presented in the Special Issue to look at some of the first steps that are underway toward establishing a needed measurement base for information technology. The introduction briefly discusses the various papers and their relationships to each other and to the overall issue of measurements for information technology.
Citation
Standard View
Volume
5
Issue
No. 3
Pub Type
Journals

Keywords

conformance tests, conformity assessments, electronic commerce, information technology, measurements, metrology, standards, traceability

Citation

Wakid, S. and Radack, S. (1997), Overview for Special Issue of Standard View, Standard View (Accessed October 17, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created August 31, 1997, Updated October 12, 2021
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