Tang, Y.
, Wood, B.
and Hamilton, C.
(2008),
A TWO-WAY JOSEPHSON VOLTAGE STANDARD COMPARISON BETWEEN NIST AND NRC, Conference on Precision Electromagnetic Measurements Conference Digest, Broomfield, CO, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32874 (Accessed May 12, 2026)
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A TWO-WAY JOSEPHSON VOLTAGE STANDARD COMPARISON BETWEEN NIST AND NRC
Published
Author(s)
, Barry Wood, Clark Hamilton
Abstract
A two-way Josephson voltage standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the National Research Council (NRC) has been conducted. The process consists of two comparisons, one using NIST designed hardware and software and the other using NRC designed hardware and software. The results of the two comparisons are in agreement to within 0.7 nV and their mean indicates that the difference between the two JVSs at 10 V is -0.28 nV with a pooled combined uncertainty of 2.07 nV (k = 2).Proceedings Title
Conference on Precision Electromagnetic Measurements Conference Digest
Conference Dates
June 8-14, 2008
Conference Location
Broomfield, CO, USA
Conference Title
Conference on Precision Electromagnetic Measurements
Pub Type
Conferences
Download Paper
Keywords
direct comparison, Josephson voltage standard, uncertainty
Citation
Issues
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Created May 31, 2008, Updated October 12, 2021