Phillips, W.
(1996),
A Beam Line for Highly Charged Ions Extracted from the NIST EBIT, Review of Scientific Instruments (Accessed October 8, 2026)
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A Beam Line for Highly Charged Ions Extracted from the NIST EBIT
Published
Author(s)
Citation
Review of Scientific Instruments
Volume
67
Pub Type
Journals
Citation
Issues
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Created January 1, 1996, Updated February 17, 2017