In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines like CPW and microstrip on lossless substrates, and to lines on lossy silicon typical of high-speed interconnects including VLSI interconnects.
Conference Dates: August 17-24, 2002
Conference Location: Maastricht, NL
Conference Title: 2002 URSI General Assembly
Pub Type: Conferences
characteristic impedance, on-wafer measurement, planar transmission lines