Ono, R.
and Benz, S.
(1999),
Optimum Characteristics of High Temperature Josephson Junctions for "Lumped" Array Applications, Proc., 7th Intl. Superconductive Electronics Conf. (ISEC), Berkeley, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=17550
(Accessed October 13, 2025)
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Optimum Characteristics of High Temperature Josephson Junctions for "Lumped" Array Applications
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Author(s)
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Abstract
We present design criteria for arrays of Josephson junctions optimized for use in the Josephson digital-analog converter and for a THz oscillator. We will briefly analyze existing high temperature superconducting Josephson junction processes and describe possible implementaiton of a lumped array using electron-beam-damaged junctions and bilayer-SNS junctions.Proceedings Title
Proc., 7th Intl. Superconductive Electronics Conf. (ISEC)
Issue
2
Conference Dates
June 21-25, 2099
Conference Location
Berkeley, CA, USA
Pub Type
Conferences
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Keywords
high t<sub>c</sub>, josephson junction, josephson arrays
Citation
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Created May 31, 1999, Updated October 12, 2021